Job split as per test group in target-testing stage#221
Merged
jaenrig-ifx merged 4 commits intoports-psoc6-mainfrom Aug 13, 2025
Merged
Job split as per test group in target-testing stage#221jaenrig-ifx merged 4 commits intoports-psoc6-mainfrom
jaenrig-ifx merged 4 commits intoports-psoc6-mainfrom
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Signed-off-by: jaenrig-ifx <enriquezgarcia.external@infineon.com>
Signed-off-by: jaenrig-ifx <enriquezgarcia.external@infineon.com>
Signed-off-by: jaenrig-ifx <enriquezgarcia.external@infineon.com>
Signed-off-by: jaenrig-ifx <enriquezgarcia.external@infineon.com>
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Code size report: |
NikhitaR-IFX
approved these changes
Aug 13, 2025
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NikhitaR-IFX
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Rest all good and all green! 👏
| - board: CY8CPROTO-063-BLE | ||
| test-suite: vfs-sdcard | ||
| - board: CY8CKIT-062S2-AI | ||
| test-suite: vfs-sdcard |
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We can add all excluded tests for CY8CKIT-062S2-AI under one? Like:
test-suite:
- vfs-sdcard
- bitstream
- ...
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This is painfully slow, and after fixing the bitstream and time pulse, I will try to group then again.
Consider this intermediate commit and approach which will allow to increase the grouping when the sequence that not fail, and split in more isolated tests (directly after flashing) when we need a fully clean board.